发明名称 |
SEMICONDUCTOR DEVICE AND ITS MANUFACTURE |
摘要 |
PURPOSE: To obtain a high speed bipolar transistor having high reliability by suppressing electric field concentration in an end portion of an intrinsic base region. CONSTITUTION: A depth of a recessed portion 20 formed on the surface of epitaxial layer 4 is restricted in such a manner that it will not exceed 0.1μm in order to suppress electric field concentration in an end portion of an intrinsic base region 12 near a junction between the intrinsic base region 12 formed directly below the recessed portion 20 and an external base region 11 formed outside the recessed portion.
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申请公布号 |
JPH08288299(A) |
申请公布日期 |
1996.11.01 |
申请号 |
JP19950095222 |
申请日期 |
1995.04.20 |
申请人 |
MITSUBISHI ELECTRIC CORP |
发明人 |
IKEDA TATSUHIKO;KUBO SHUNJI;YAMAWAKI MASAO;YOSHIHISA YASUKI |
分类号 |
H01L29/73;H01L21/265;H01L21/331;H01L29/10;H01L29/732;(IPC1-7):H01L21/331 |
主分类号 |
H01L29/73 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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