| 摘要 |
PURPOSE: To analyze the structure of material by scanning each measuring unit independently using a spherical diffractometer, especially mounting a plurality of radiation measuring units. CONSTITUTION: Basically, the spherical diffractometer has (single axis + 2n axes (nεN) constitution where a plurality of pairs of independently scannable arcuate goniometers 5 (κaxis) and a linear slider 6 (ηaxis) are mounted on a single annular goniometers 4 (ξaxis). A plurality of radiation measuring units 7 are scanned independently on arbitrary spherical coordinates having an origin 2 matching that of a sample (center of scattering) thus measuring the intensity, energy spectrum, etc., of radiation 3 from the sample.
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