发明名称 MANUFACTURE OF THIN FILM
摘要 <p>PURPOSE: To remove an unwanted film inside a reaction furnace as a whole and to restrain particles from being generated at the time of film formation by a method wherein a cleaning process is performed in at least two steps in which a cleaning condition is different. CONSTITUTION: A valve 25 is opened, nitrogen trifluoride is introduced into a reaction furnace via a cleaning-gas supply pipe 23, a valve 22 is opened, and argon is introduced into the reaction furnace via the cleaning-gas supply pipe 23. Then, an inessential film on the surface of a suspector and that on the surface of a mask are removed by a plasma cleaning operation. In succession, while a discharge is being continued, the valve 25 is opened. Then, the nitrogen trifluoride is introduced into the reaction furnace via the cleaning-gas supply pipe, the valve 22 is opened, and the argon is introduced into the reaction furnace via the cleaning-gas supply pipe. Then, the inessential film is removed by a plasma cleaning operation.</p>
申请公布号 JPH08288223(A) 申请公布日期 1996.11.01
申请号 JP19950088523 申请日期 1995.04.13
申请人 TOSHIBA CORP 发明人 NAGAHISA SHUYA
分类号 G02F1/136;G02F1/1368;H01L21/205;H01L21/302;H01L21/304;H01L21/3065;(IPC1-7):H01L21/205 主分类号 G02F1/136
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