发明名称 PRODUCTION OF TIP FOR ATOMIC FORCE MICROSCOPE
摘要 PURPOSE: To produce a tip for atomic force microscope having small dimensions with high accuracy and to compose the tip of substantially pure silicon. CONSTITUTION: A uniformly tapered tubular tip 10 having circumferential surface and front end part surface 13 is formed. Carbon masks 15a, 15c are formed on the tip along the circumferential surface and a carbon mask 15b is formed on the front end part surface 13. In order to remove the material from the tip and each carbon mask, the tip is etched for a predetermined time and upon elapse of a predetermined time, each mask is removed completely. Three spikes 32a, 32b, 32c directing the position, from where each mask is removed, are formed by removing the material from the tip.
申请公布号 JPH08285872(A) 申请公布日期 1996.11.01
申请号 JP19960044805 申请日期 1996.03.01
申请人 TOSHIBA CORP 发明人 MITSUI TADASHI;OKUMURA KATSUYA
分类号 G01B21/30;B81B1/00;G01N37/00;G01Q60/24;G01Q70/10;G01Q70/16;H01J37/28;(IPC1-7):G01N37/00 主分类号 G01B21/30
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