Circuit board exchange mechanism for semiconductor test system

摘要

The semiconductor test system has several test channels. The exchange mechanism is used to carry out a particular diagnosis test. A test head is connected to the semiconductor test system. The test head has several printed circuit boards corresponding to the several test channels. A disc measurement tester has a pin card to electrically contact a semiconductor disc to be tested. The card conveys test signals from the test system to the semiconductor disc and transmits output signals from the disc to the test system. A power circuit board couples the several PCB's and the pin card when the test head and disc measurement tester are mechanically connected together. A specific diagnosis circuit board is provided which is the same size as the pin card. The pin card is exchanged with the diagnosis circuit board before the specific diagnosis while the test head and the disc tester remain mechanically coupled together. The power circuit board couples the several PCB's with the specific diagnosis circuit board.