发明名称 EEPROM Flashzelle sowie Verfahren zu deren Herstellung
摘要 A flash EEPROM cell is made by forming films of tunnel oxide 2, polysilicon 3B and a dielectric 14 on Si substrate 1, masking and etching to expose strips of substrate and forming a source 6A and a drain 7A region by injecting first impurity ions. A second oxide film (16 Figure 3B) is grown over source and drain regions, then a second polysilicon film (15), these are masked and etched to expose strips of substrate 1 at right angle to the first strips, second impurity ions being injected to form cell isolation regions (18 Figure 3C). This gives a floating gate 3B and a control gate 15A stacked over it. The dielectric film 14 is oxide 12 and nitride 13. Using this process the silicon substrate is not under-cut.
申请公布号 DE19616603(A1) 申请公布日期 1996.10.31
申请号 DE19961016603 申请日期 1996.04.25
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., ICHON, KYOUNGKI, KR 发明人 AN, JAE CHUN, SEOUL/SOUL, KR
分类号 H01L27/115;H01L21/8247;(IPC1-7):H01L27/115;H01L21/824 主分类号 H01L27/115
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