发明名称 |
EEPROM Flashzelle sowie Verfahren zu deren Herstellung |
摘要 |
A flash EEPROM cell is made by forming films of tunnel oxide 2, polysilicon 3B and a dielectric 14 on Si substrate 1, masking and etching to expose strips of substrate and forming a source 6A and a drain 7A region by injecting first impurity ions. A second oxide film (16 Figure 3B) is grown over source and drain regions, then a second polysilicon film (15), these are masked and etched to expose strips of substrate 1 at right angle to the first strips, second impurity ions being injected to form cell isolation regions (18 Figure 3C). This gives a floating gate 3B and a control gate 15A stacked over it. The dielectric film 14 is oxide 12 and nitride 13. Using this process the silicon substrate is not under-cut.
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申请公布号 |
DE19616603(A1) |
申请公布日期 |
1996.10.31 |
申请号 |
DE19961016603 |
申请日期 |
1996.04.25 |
申请人 |
HYUNDAI ELECTRONICS INDUSTRIES CO., LTD., ICHON, KYOUNGKI, KR |
发明人 |
AN, JAE CHUN, SEOUL/SOUL, KR |
分类号 |
H01L27/115;H01L21/8247;(IPC1-7):H01L27/115;H01L21/824 |
主分类号 |
H01L27/115 |
代理机构 |
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代理人 |
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地址 |
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