Vertically operative probe card assembly

摘要

A vertically operative probe card for inspecting electrical characteristics of objectives of interest comprises a combination of a printed circuit board disposed in parallel with an objective of interest located downward and a probe card assembly including a plurality of probes extending vertically, downwardly from underside of the printed circuit board; the probe card assembly includes first spacer bars mounted vertically, downwardly from the underside of the printed circuit board, and a first lateral board connects down ends of the first spacer bars laterally in parallel with the printed circuit board; second spacer bars are mounted vertically, downwardly extending from the first spacer bars, and a second lateral board connects down ends of the second spacer bars laterally in parallel with the printed circuit board; the first and second lateral boards is provided with through holes in correspondence to locations and number of the probes to admit the probes to penetrate therethrough and to make contacts onto the objective of interest; each probe has a curve or laterally set U letter shaped portion which is heightwise received between the first and second lateral boards.