发明名称 Method and apparatus for producing plasma uniformity in a magnetic field-enhanced plasma reactor
摘要 <p>A magnetic field enhanced plasma etch reactor system (100) for generating a radially-directed magnetic field within a reaction chamber (108). The reactor system (100) comprises a reaction chamber (108) for containing a plasma and a plurality of electromagnetic coils (118, 120, 122, 124) disposed about a reaction region within the reaction chamber (108). When each coil is driven with a current of similar magnitude, the electromagnetic coils (118, 120, 122, 124) produce a radially-directed magnetic field within the reaction chamber (108). The radially-directed magnetic field uniformly distributes the plasma throughout a bulk plasma region. Consequently, a substrate (116) that is etched by such a uniform plasma has an improved uniformity in the etch pattern on the substrate (116). &lt;IMAGE&gt;</p>
申请公布号 EP0740328(A2) 申请公布日期 1996.10.30
申请号 EP19960105636 申请日期 1996.04.10
申请人 APPLIED MATERIALS INC. 发明人 PU, BRYAN;SHAN, HONGCHING
分类号 H01J37/32;H01L21/302;H01L21/3065;H05H1/46;(IPC1-7):H01J37/32 主分类号 H01J37/32
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