发明名称 FLUID-COOLED APPARATUS FOR TESTING POWER SEMICONDUCTOR DEVICES
摘要 The apparatus includes a base member having an upper surface and a cavity therein, with a channel in the interior which communicates with the cavity. The surface has an aperture communicating with the cavity. A power semiconductor device is held in the aperture with an outer heat transfer surface of the device exposed in the cavity, and a fluid is circulated through the channel and cavity and across the heat transfer surface. A tunable weir in the cavity provides means for controlling the fluid, to minimize the thermal resistance between the heat transfer surface and the fluid.
申请公布号 US3648167(A) 申请公布日期 1972.03.07
申请号 USD3648167 申请日期 1970.06.01
申请人 RCA CORP. 发明人 DON RYALL PURDY;WILLIAM EDWARD DONNELLY
分类号 G01R1/067;G01R31/26;(IPC1-7):G01R1/04 主分类号 G01R1/067
代理机构 代理人
主权项
地址