Curved surface measuring method, e.g. for optical waveguide

摘要

External deformities are produced on the outer surface of the waveguide for different optical waveguide spacings. These height differences from the ideal, straight profile can be detected by tangential illumination and simultaneous tangential image pickup by a camera (8). A reference blade (10) is provided at a small distance from the waveguide. A screen is provided in front of the light source (5) to generate parallel light beams. The camera is preferably a semiconductor CCD camera.