| 摘要 |
A device for measuring force components, in single crystal material, consisting of at least one cantilever beam (1, 2, 3, 4) inclined to the plane normal, with adherent mass of inertia is described. It is particularly characterized in that the angle to the plane normal of the cantilever beam is achieved through etching of the single crystal material, and is defined by the inclination of one of the crystal planes that constitute the beam and that normally, the bending of the cantilever beam inclined to the plane normal principally occurs towards the beam. A method of manufacturing such a device is also described. |
