| 摘要 |
PCT No. PCT/GB96/00826 Sec. 371 Date Dec. 15, 1997 Sec. 102(e) Date Dec. 15, 1997 PCT Filed Apr. 3, 1996 PCT Pub. No. WO96/31847 PCT Pub. Date Oct. 10, 1996A coin validator with an improved coin processing rate, performs primary validation testing on coins at a primary validation station as successive coins roll down a coin rundown path. Unacceptable coins pass to a coin reject path but coins found acceptable by the primary validation testing are deflected by a solenoid operated gate to a coin accept path. The acceptable coins pass a further sensor coil. Auxiliary coin testing is carried out by a microprocessor by analyzing the time taken for the coin to reach and move away form the further sensor. The microprocessor performs undertimer and overtimer routines FIGS. 3A, B and if the coin arrives within the under and overtimer ranges t1, t2, the coin is accepted. When the coin throughput rate is increased, the undertimer is switched off in order to permit the coin throughput rate for valid coins to be increased, without loss of security. |
