发明名称 CHARACTERISTIC MEASURING METHOD AND CONTROL METHOD OF OPTICAL INTENSITY MODULATOR
摘要 PURPOSE: To provide the characteristic measuring method of an optical intensity modulator, in which the parameter of the optical intensity modulator can be measured with high accuracy in a simple and low-cost constitution and to provide the control method of an optical intensity modulator, which can control the characteristic of the optical intensity modulator without hardly affecting a modulated signal waveform and a transmission characteristic. CONSTITUTION: A first light-emitting means 1 emits first light, the optical intensity of which has been modulated, by an optical intensity-to-be-measured modulator 8 in which a phase is modulated by a control signal and to which a sine- wave electric signal of a specific frequency is applied. A mixing means 3 mixes the first light and second light, from a second light-emitting means 2, whose wavelengths are different so as to be made incident on a photodetector 4. A control means 5 controls an optical phase modulator 7 by generating a level- variable signal in such a way that the level of a prescribed odd-order sideband frequency signal near a frequency corresponding to the wavelength difference between the first light and the second light in the output electric signal of the photodetector 4 becomes minimum.
申请公布号 JPH08278224(A) 申请公布日期 1996.10.22
申请号 JP19950083912 申请日期 1995.04.10
申请人 NEC CORP 发明人 FUKUCHI KIYOSHI
分类号 G01R29/12;G01M11/00;G02F1/03;G02F1/35;H04B10/07;H04B10/255;H04B10/516;H04B10/54;H04B10/548;H04B10/564;H04B10/588;H04B10/61 主分类号 G01R29/12
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