发明名称 Wafer prober
摘要 A test head is rotatably supported by a main body of device. This test head is rotatable between an inspecting position electrically connected to a probe card and a retracted position being retracted from the inspecting position. The test head is connected thereto with a cylinder for weight balance for decreasing the tare of the test head, and the center of rotation of the connecting point of the cylinder for weight balance is made eccentric from the center of rotation of the test head. With this arrangement, the balancing force of the cylinder for weight balance can be rendered to the test head without fluctuations. As described above, the balancing force can be rendered to the test head during the rotation of the test head without fluctuations, so that the rotating operation of the test head can be facilitated.
申请公布号 US5568056(A) 申请公布日期 1996.10.22
申请号 US19940348893 申请日期 1994.11.25
申请人 TOKYO SEIMITSU CO., LTD. 发明人 ISHIMOTO, TAKASHI
分类号 G01R31/28;G01R1/073;H01L21/66;(IPC1-7):G01R31/02 主分类号 G01R31/28
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