发明名称 ERASURE CHARACTERISTICS ENHANCING CIRCUIT FOR NONVOLTATILE MEMORY
摘要 <p>PURPOSE: To enhance the data erasure characteristics of EEPROM by controlling the magnitude of data erasure voltage for each memory cell depending on the current flowing through the bit, line of a nonvolatile memory. CONSTITUTION: In an EEPROM, a read voltage is applied in order to convert the current flowing on a bit line 8 into a voltage through a sense amplifier 12. The voltage indicative of the current is then converted through an AD converter 13 into a digital value. An operational logic unit 18 compares the digital output from the AD converter 13 with a value read out from a ROM. When a logical operation output indicative of unmatching is delivered from the unit 18 to a decision section 17, count in a program counter 16 is altered to match with an output read out from a mask ROM 15. Consequently, a matched output data is delivered from the unit 18, the count in the counter 16 is altered, a table data is read out from the ROM 15, a corresponding control bit is set in a register 20 and negative charges in an MOS transistor 6 are offset.</p>
申请公布号 JPH08273378(A) 申请公布日期 1996.10.18
申请号 JP19950073976 申请日期 1995.03.30
申请人 SANYO ELECTRIC CO LTD 发明人 OSAWA HIROSHI
分类号 G11C17/00;G11C16/02;G11C16/06;(IPC1-7):G11C16/06 主分类号 G11C17/00
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