发明名称 SEMICONDUCTOR SUBSTRATE CLEANING DEVICE, CLEANING METHOD AND FORMATION OF CLEANING LIQUID
摘要 PURPOSE: To provide a cleaning device, which can remove organic and metallic impurities on the surfaces if wafers without using a chemical liquid and ultrapure water in large quantities, a method of cleaning the wafers and a method of forming a cleaning liquid and to contrive to reduce the production cost of a semiconductor device and an environmental load. CONSTITUTION: Pure water is put in a cleaning tank 6 consisting of a PEEK material through a pure water feed opening 2, Cl2 is bubbled in the pure water through a Cl2 feed opening 1A, a cleaning liquid containing chlorine ions, hypochlorous acid ions and chloric acid ions is formed and wafers 5 are made to immerse in this cleaning liquid and are cleaned.
申请公布号 JPH08274057(A) 申请公布日期 1996.10.18
申请号 JP19950072927 申请日期 1995.03.30
申请人 NEC CORP 发明人 SHIROMIZU YOSHIMI
分类号 C11D7/60;B08B3/08;C02F1/42;H01L21/00;H01L21/304;H01L21/306;H01L21/308;(IPC1-7):H01L21/304 主分类号 C11D7/60
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