发明名称 Scannable last-in-first-out register stack
摘要 <p>A scannable LIFO register stack in which registers are arranged in a stack with each register having a number of bit locations. Each register is in communication with an adjacent register located above and below it. In particular, each bit location in a register within the stack located between the top and the bottom register is in communication with a corresponding bit location in an adjacent register located above the register and a corresponding bit location in an adjacent register located below the register. Except for the last bit, each bit location in the top register has a connection to an offset bit location in the bottom register. Shifting a bit of data from a bit location in the top register to the offset bit location in the bottom register results in the bit being shifted to the right by one bit location according to the present invention. The last bit location in the top register has an output that is used as a scan output. The first bit location in the bottom register has an input used as a scan input. &lt;IMAGE&gt;</p>
申请公布号 EP0737913(A1) 申请公布日期 1996.10.16
申请号 EP19960480041 申请日期 1996.04.04
申请人 INTERNATIONAL BUSINESS MACHINES CORPORATION 发明人 PEDERSEN, MARK ERIC
分类号 G01R31/3185;G11C7/00;G06F5/06;G11C29/00;G06F7/78;(IPC1-7):G06F7/00;G01R31/318 主分类号 G01R31/3185
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