发明名称
摘要 <p>PURPOSE:To prevent occurrence of after corrosion, by temporarily storing materials to be treated between atmosphere and a treating chamber in a vacuum state, generating oxygen radical and ozone with active species producing means, which is arranged in a vacuum storing chamber, and performing etching. CONSTITUTION:Wafers 15 are stored in a storing cassette 5 in a vacuum chamber 4 through a transfer mechanism 2 and an airtight valve 3 from a wafer cassette 1. An active species producing means 30, which is provided in the vacuum chamber 4, is composed of a gas introducing port 20, a plasma chamber 17 and a high frequency applying coil 18. Electric discharge is generated in gas inside the plasma chamber 17 by electric power, which is applied from a high frequency power source 31, and plasma is formed. Active species are conveyed on a gas stream from the introducing port 20 to an evacuation port 19. The active seeds react with a material to be treated on the wafers in the middle of the path, and etching is performed. Then the inside of the vacuum chamber 4 is evacuated. The wafers are conveyed with a vacuum conveying mechanism 16 and mounted on a parallel planer electrode 12 in a plasma treating chamber 9.</p>
申请公布号 JP2544129(B2) 申请公布日期 1996.10.16
申请号 JP19870067425 申请日期 1987.03.23
申请人 ANELVA CORP 发明人 FUJIMOTO HIDEKI
分类号 B01J19/08;C23C16/50;C23C16/511;H01L21/302;H01L21/3065;H01L21/677;(IPC1-7):H01L21/306 主分类号 B01J19/08
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