发明名称 Projection exposure apparatus and microdevice manufacturing method using the same
摘要 <p>A projection exposure apparatus includes an illumination optical system for illuminating a first object (1) with exposure light (IL), a projection optical system (3) for projecting a pattern of the first object illuminated by the illumination optical system onto a second object (4), an alignment optical system (8-11) for illuminating the second object with alignment light (AL) of a wavelength different from the exposure light and for detecting alignment light from the second object through the projection optical system, and a moving mechanism for moving the first object to a position (A), different from a position (B) of the first object for the projection exposure, so that the alignment optical system detects the alignment light from the second object through the projection optical system. &lt;IMAGE&gt;</p>
申请公布号 EP0737898(A1) 申请公布日期 1996.10.16
申请号 EP19960302526 申请日期 1996.04.10
申请人 CANON KABUSHIKI KAISHA 发明人 MORI, TETSUYA;KOSUGI, MASAO
分类号 G03F7/20;G03F9/00;H01L21/027;(IPC1-7):G03F9/00 主分类号 G03F7/20
代理机构 代理人
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