发明名称 |
SEMICONDUCTOR DEVICE AND METHOD FOR MANUFACTURING THE SAME |
摘要 |
The semiconductor device with trench-isolation has a trench-isolation film(2A) formed on the boundary of an active region(C) and a field region(D), and a gate oxide(3A) of the field region(D) thicker than a gate oxide(3) of the active region(C). The device enables to prevent deterioration of properties of semiconductor device due to a parasitic capacitor between a gate electrode line and a semiconductor substrate.
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申请公布号 |
KR960014456(B1) |
申请公布日期 |
1996.10.15 |
申请号 |
KR19940000972 |
申请日期 |
1994.01.19 |
申请人 |
HYUNDAI ELECTRONICS IND. CO., LTD |
发明人 |
KIM, JAE-KAP |
分类号 |
H01L21/316;H01L21/76;H01L21/762;(IPC1-7):H01L21/76 |
主分类号 |
H01L21/316 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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