发明名称 SEMICONDUCTOR MEMORY AND VOLTAGE APPLICATION METHOD
摘要 PURPOSE: To reduce the chip size by simplifying the layout and fabrication process of a DRAM memory cell employing the field shield isolation structure. CONSTITUTION: The cell plate electrode 7 of a capacitor 12 constituting a DRAM memory cell along with am MOS transistor 11 is connected electrically with a shield gate electrode 8. A voltage causing no channel to be formed in a silicon substrate 1 under a shield gate electrode 8 is then applied between the silicon substrate 1 and the cell plate electrode 7 and the shield gate electrode 8.
申请公布号 JPH08264729(A) 申请公布日期 1996.10.11
申请号 JP19950088737 申请日期 1995.03.22
申请人 NIPPON STEEL CORP 发明人 NAGANUMA TAKESHI
分类号 H01L21/76;H01L21/8242;H01L27/108 主分类号 H01L21/76
代理机构 代理人
主权项
地址