发明名称 Determination of phases and phase differences of light reflecting from specular or diffusely reflecting, or transparent surface of object
摘要 The method uses light or infrared radiation with rays reflected in a shifting or distorted condition, either from an object with a diffusely reflecting surface, from a transparent object or from the surface of a mirror. The object (10) is irradiated by a coherent beam (11) of known frequency. The reflected rays (12) pass through an imager (13) to a sensor (15). The sensor is composed of many regularly arranged pixels (16). A superimposed reference ray (14) of equal frequency and defined phase produces an speckle interference pattern (17). The intensity values of the pattern are processed to give the calculated phase difference.
申请公布号 DE19513233(A1) 申请公布日期 1996.10.10
申请号 DE1995113233 申请日期 1995.04.07
申请人 ETTEMEYER, ANDREAS, DR.-ING., 89231 NEU-ULM, DE 发明人 ETTEMEYER, ANDREAS, DR.-ING., 89231 NEU-ULM, DE;WANG, ZHIGUO, DIPL.-ING., 85221 DACHAU, DE
分类号 G01B9/02;G01J9/02;G02B27/48;(IPC1-7):G01J9/04;G01J1/16 主分类号 G01B9/02
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