| 摘要 |
FIELD: remote measurement of thickness of walls of articles made from glass, quartz and other transparent materials whose refraction indices are unknown. SUBSTANCE: contactless method for measurement of thickness of transparent materials includes direction to measured object of, at least, two radiation beams from the source intercrossing on the object at angle larger than 0 and less than 90 deg. Formed by optical system in plane of photodetector are, at least, two pairs of images formed by beams reflected from the external and internal surfaces of object. Simultaneously, produced images are scanned, distance between them is determined and thickness of the object is determined. EFFECT: higher accuracy of measurement due to elimination of adverse effect of material refraction index on the measurement results. 1 cl, 1 dwg |
