发明名称 |
NON-VOLATILE SEMICONDUCTOR MEMORY |
摘要 |
The method of manufacturing non-volatile semiconductor memory comprises the steps of : forming a tunneling oxide(2) on a silicone substrate(1); forming a first polysilicon layer(3) on the tunneling oxide(2); forming an insulating film(4) on the surface of the first polysilicone layer(3); forming a second polysilicone layer(5) on the insulating film(4); patterning the tunneling oxide(2), the first polysilicone layer(3), the insulating film(4) and the second polysilicone layer(5); and forming a source(6) and a drain(7) on the silicone substrate(1) by ion-injecting.
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申请公布号 |
KR960013946(B1) |
申请公布日期 |
1996.10.10 |
申请号 |
KR19930013480 |
申请日期 |
1993.07.16 |
申请人 |
LG SEMICONDUCTOR CO., LTD |
发明人 |
HWANG, HYUN-SANG |
分类号 |
H01L29/788;(IPC1-7):H01L29/788 |
主分类号 |
H01L29/788 |
代理机构 |
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代理人 |
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主权项 |
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地址 |
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