发明名称 FRINGE EXAMINING APPARATUS
摘要 The apparatus is for enabling the examination for the interference fringe with the naked eye by magnifying the frequency of the interference fringe. The apparatus comprises: a light source(21); a first beam splitter(22) for splitting the first order beam into the first first-order and the second first-order beams; a first and a second total reflection mirrors(23, 24) for reflecting the first order and the second second-order beams to cross each other at the prescribed place; a second beam splitter(25) for penetrating and reflecting the first second-order beam to divide into the first and the second third-order beams and penetrating and reflecting the second second-order beam to divide into the third and the fourth third-order beams; and a screen(26) for projecting the magnified fringe image.
申请公布号 KR960013680(B1) 申请公布日期 1996.10.10
申请号 KR19920027319 申请日期 1992.12.31
申请人 HYUNDAI ELECTRONICS IND. CO.,LTD. 发明人 KIM, TAE-JIN;LEE, DOO-HWAN
分类号 G01B11/02;(IPC1-7):G01B11/02 主分类号 G01B11/02
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