发明名称 |
FRINGE EXAMINING APPARATUS |
摘要 |
The apparatus is for enabling the examination for the interference fringe with the naked eye by magnifying the frequency of the interference fringe. The apparatus comprises: a light source(21); a first beam splitter(22) for splitting the first order beam into the first first-order and the second first-order beams; a first and a second total reflection mirrors(23, 24) for reflecting the first order and the second second-order beams to cross each other at the prescribed place; a second beam splitter(25) for penetrating and reflecting the first second-order beam to divide into the first and the second third-order beams and penetrating and reflecting the second second-order beam to divide into the third and the fourth third-order beams; and a screen(26) for projecting the magnified fringe image.
|
申请公布号 |
KR960013680(B1) |
申请公布日期 |
1996.10.10 |
申请号 |
KR19920027319 |
申请日期 |
1992.12.31 |
申请人 |
HYUNDAI ELECTRONICS IND. CO.,LTD. |
发明人 |
KIM, TAE-JIN;LEE, DOO-HWAN |
分类号 |
G01B11/02;(IPC1-7):G01B11/02 |
主分类号 |
G01B11/02 |
代理机构 |
|
代理人 |
|
主权项 |
|
地址 |
|