发明名称 MANUFACTURE OF SHALLOW JUNCTION SEMICONDUCTOR DEVICE
摘要 forming a field oxide film(2), a gate oxide film(4), a polysilicon gate(3), a side wall spacer(5), and a source/drain junction(6) on a silicon substrate(1); evaporating a polysilicon film(7) in a finite thickness on a surface of wafer; crystallizing the polysilicon film(7) by a heat treatment; removing all remains except for a photoresistor(8-1); removing all remains except for a silicon layer(7-1) by the etch-back; injecting an impurity into the source/drain region; forming source/drain junction(9); performing a heat treatment.
申请公布号 KR960013624(B1) 申请公布日期 1996.10.10
申请号 KR19920025020 申请日期 1992.12.22
申请人 KOREA ELECTRONICS & TELECOMMUNICATION RESEARCH INSTITUTE;KOREA TELECOM CORP. 发明人 BAEK, JONG-TAE;SONG, YUN-HO;YU, JONG-SUN;NAM, KI-SOO
分类号 H01L21/335;(IPC1-7):H01L21/335 主分类号 H01L21/335
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