发明名称 INSPECTION SUPPORT DEVICE
摘要 PURPOSE: To provide an inspection support device which supports the understanding of an inspection target and situations around it and facilitates inspection and monitoring works. CONSTITUTION: An inspection support device is provided with a signal processing part 3 for generating three-dimensional structure of an inspection target based on measurement data obtained from the inspection target, a measurement result record part 5 for recording the three-dimensional structure data from this signal processing part 3, and a three-dimensional shape storage part 6 for storing the three-dimensional shape model data around the inspection tact as known data beforehand. And it is also provided with an operation part 7 for inputting viewpoint information and display set information of a display image plane for the measurement target, and a presentation part 8 for composing the three- dimensional structure data and the three-dimensional shape model data so as to display graphics.
申请公布号 JPH08254418(A) 申请公布日期 1996.10.01
申请号 JP19950058600 申请日期 1995.03.17
申请人 TOSHIBA CORP 发明人 KATO KATSUMI;DOI MIWAKO
分类号 G01B17/00;G01B17/06;G06T1/00;G06T7/00;G06T17/00 主分类号 G01B17/00
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