发明名称 SEMICONDUCTOR DEVICE AND MANUFACTURE THEREOF
摘要 <p>PURPOSE: To simplify a process for manufacturing a semiconductor device provided with a non-volatile memory and to flatten the surface of the device. CONSTITUTION: An SOI-MOSFET 6 has such a structure that a source/drain is formed on an SOI layer 3B provided to a silicon substrate 1 through the intermediary of a buried oxide film 2, and a gate oxide film 4B and a gate electrode 5B are provided onto the source/drain. A MOSFET 7 used for a memory is composed of a source/drain formed on a silicon substrate 1, a buried oxide film 2 and the gate oxide film 2A formed at the same time, an SOI layer 3B and a floating gate 3A of single crystal semiconductor layer provided concurrently, and furthermore a gate oxide film 4B, a gate electrode 5B, an insulating film 4A, and a control gate 5A formed at the same time respectively.</p>
申请公布号 JPH08255846(A) 申请公布日期 1996.10.01
申请号 JP19950058371 申请日期 1995.03.17
申请人 NIPPONDENSO CO LTD 发明人 ASAI SHOKI;TSURUTA KAZUHIRO
分类号 H01L21/8247;H01L21/76;H01L27/00;H01L27/06;H01L27/10;H01L29/786;H01L29/788;H01L29/792;(IPC1-7):H01L21/824 主分类号 H01L21/8247
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