发明名称 Storage electrode of DRAM cell
摘要 A storage electrode of a DRAM cell in a highly-integrated semiconductor device has, in order to secure the surface area thereof greater than that of a conventional tunnel-type storage electrode, an upper plate of storage electrode formed over a lower plate of storage electrode separated therefrom by a predetermined distance, while interposing bars of irregularly shapes formed of a conductive layer to electrically connect the upper and lower plates.
申请公布号 US5561310(A) 申请公布日期 1996.10.01
申请号 US19950380654 申请日期 1995.01.30
申请人 HYUNDAI ELECTRONICS INDUSTRIES CO., LTD. 发明人 WOO, SANG H.;JEON, HA E.;PARK, YOUNG J.
分类号 H01L21/28;H01L21/033;H01L21/306;H01L21/822;H01L21/8242;H01L27/04;H01L27/10;H01L27/108;(IPC1-7):H01L27/108 主分类号 H01L21/28
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