发明名称 APPARATUS FOR MEASURING PHYSICAL PROPERTIES UNDER MAGNETIC FIELD
摘要 PURPOSE: To obtain a small-sized apparatus for measuring physical properties under magnetic field in which installation and running cost is reduced while facilitating replacement of sample. CONSTITUTION: In the apparatus for measuring physical properties under field wherein a sample holder 14 is disposed under the field generated from a superconducting magnet 13, the superconducting magnet 13 and the sample holder 14 are thermally coupled, respectively, with first and second stages 17, 18 of a two-stage refrigerator 16. Since only one refrigerator 16 is required, the size can be reduced along with the installation and running cost while facilitating the replacement of sample. Furthermore, the sample can be replaced quickly when the space for disposing the sample holder 14 is sealed hermetically with respect to the space for disposing the superconducting magnet 13 and a vacuum container 11 and the sample holder 14 can be opened directly to the outside of the vacuum container 11.
申请公布号 JPH08248001(A) 申请公布日期 1996.09.27
申请号 JP19950049768 申请日期 1995.03.09
申请人 FURUKAWA ELECTRIC CO LTD:THE 发明人 TSUBOUCHI HIROKAZU;KIMURA AKIO
分类号 G01R33/12;F25B9/00;G01N27/72;G01R33/3815;(IPC1-7):G01N27/72;G01R33/381 主分类号 G01R33/12
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