发明名称 MANUFACTURE OF SEMICONDUCTOR DEVICE
摘要 PROBLEM TO BE SOLVED: To easily manufacture a semiconductor device by providing a gap that is filled with air or a gas for reducing a capacitance being generated between conductors, for example, by partially eliminating a dielectric around a conductor through a plurality of openings formed on a passivation layer by etching. SOLUTION: A semiconductor device is finished to a level, where a contact part and/or conductor path 2 that are electrically and mutually insulated by a dielectric is provided, and the upper surface of the device is covered with a passivation layer 6 for selectively eliminating the dielectric. Then, an opening 7 is formed so that it is sufficiently large and is in multiples with respect to a next process and is sufficiently small for the next process. Then, a dielectric around a contact part and/or conductor path 2 is selectively eliminated by etching partially through an opening 7 for forming a cavity 9. Then, the opening 7 is closed by depositing at least another passivation layer 8 without filling the cavity 9.
申请公布号 JPH08250593(A) 申请公布日期 1996.09.27
申请号 JP19950325051 申请日期 1995.11.20
申请人 SIEMENS AG 发明人 MARUCHIN KERUBAA;HERUMUUTO KUROOZE;ANDOREASU FUOMU FUERUDE
分类号 H01L21/302;H01L21/3065;H01L21/768;H01L23/522;(IPC1-7):H01L21/768;H01L21/306 主分类号 H01L21/302
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