发明名称 IMPROVED NON-DESTRUCTIVELY READ FERROELECTRIC MEMORY CELL
摘要 An improved ferroelectric FET structure (10) in which the ferroelectric layer (14) is doped to reduce retention loss. A ferroelectric FET according to the present invention includes a semiconductor layer (16) having first and second contacts (18, 19) thereon, the first and second contacts being separated from one another. The ferroelectric FET also includes a bottom electrode (12) and a ferroelectric layer (14) which is sandwiched between the semiconductor layer (16) and the bottom electrode (12). The ferroelectric layer (14) is constructed from a perovskite structure of the chemical composition ABO3 wherein the B site comprises first and second elements and a dopant element that has an oxidation state greater than +4 in sufficient concentration to impede shifts in the resistance measured between the first and second contacts with time. The ferroelectric FET structure preferably comprises Pb in the A-site. The first and second elements are preferably Zr and Ti, respectively. The preferred B-site dopants are Niobium, Tantalum, and Tungsten at concentration between 1 % and 8 %.
申请公布号 WO9629742(A1) 申请公布日期 1996.09.26
申请号 WO1996US03128 申请日期 1996.03.09
申请人 RADIANT TECHNOLOGIES, INC. 发明人 EVANS, JOSEPH, TATE, JR.;WARREN, WILLIAM, L.;TUTTLE, BRUCE, A.
分类号 H01L21/8247;H01L21/8242;H01L27/10;H01L27/108;H01L29/51;H01L29/788;H01L29/792;(IPC1-7):H01L29/78 主分类号 H01L21/8247
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