FAIL REPAIR METHOD AND CIRCUIT FOR SEMICONDUCTOR MEMORY DEVICE

摘要

The semiconductor memory device is for supplying a memory block selected in test mode with a source power voltage by comprising: a block free decoder outputting the decoding result of a block selecting signal from the external as a block selecting signal; a test pad inputting a test control signal applied from the external; and a block row decoder charging the power voltage line corresponding to the selected memory block to a source power voltage level by composing the test control signal and the block selecting signal.