发明名称 Current controlling semiconductor device
摘要 The semiconductor device has a zone of a first conduction type including a channel zone with low concentration of dissociation centres. Current input and output electrodes are connected to the channel ends; and a control electrode near the channel applies to it a control voltage generating a depletion layer and defining the current channel in the channel zone.The channel zone has such a width and concentration of dissociation centres, that when a forward control voltage is applied, the channel is pinched off producing a potential barrier in the channel zone for charge carriers moving from the electrodes during the transistor main operating state. The height of the barrier is capacitively controlled by the voltage applied to the drain
申请公布号 DE2858820(C2) 申请公布日期 1996.09.19
申请号 DE19782858820 申请日期 1978.02.02
申请人 ZAIDAN HOJIN HANDOTAI KENKYU SHINKOKAI, SENDAI, MIYAGI, JP 发明人 NISHIZAWA, JUN-ICHI, SENDAI, MIYAGI, JP
分类号 H01L21/762;H01L21/763;H01L27/02;H01L27/07;H01L29/739;(IPC1-7):H01L27/07 主分类号 H01L21/762
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