发明名称 Method of destruction-free testing of surfaces using the reflected light pattern
摘要 The surface condition of a workpiece is monitored by polishing the surface (2) and then etching until the coherent light from a laser beam (7) produces the correct pattern on a projection picture (5). The coherent beam is projected at the surface at an angle of 10 - 30 deg . Etching is carried out until the amount of coherent light in the picture is minimised or completely removed (11). Pictures of the surface can then be taken.
申请公布号 DE19549233(A1) 申请公布日期 1996.09.19
申请号 DE19951049233 申请日期 1995.12.21
申请人 VEAG VEREINIGTE ENERGIEWERKE AG, 12681 BERLIN, DE 发明人 KUEHNE, CHRISTIAN, DIPL.-PHYS., 03044 COTTBUS, DE;POHL, ROLF, DIPL.-ING., 03042 COTTBUS, DE
分类号 G01B11/30;G01N1/32;G01N21/55;G01N33/20;(IPC1-7):G01B11/30;C23F1/00;G01N21/84 主分类号 G01B11/30
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