| 摘要 |
PCT No. PCT/EP96/00880 Sec. 371 Date Feb. 6, 1997 Sec. 102(e) Date Feb. 6, 1997 PCT Filed Mar. 1, 1996 PCT Pub. No. WO96/27136 PCT Pub. Date Sep. 6, 1996The invention relates to a test device for component assembly circuit boards (31), in which this test device includes a plurality of test channels which are contact-connected with respective test points (32) of the board (31) by means of spring contact pins (2, 3), whereby in accordance with the invention for the contacting of the spring contact pits with the terminals of the test channels (29) there is provided a raster plate (21) which has contact surfaces (22) on the side to be contacted with the spring contact pins, of which contact surfaces in each case n contact surfaces are electrically parallel-connected with .one another and connected with a respective test channel, whereby the test surfaces (No. 1, No. 2, . . . , No. 21, No. 41, . . . ) of the test channels (a1, a2, . . . b1, . . . c1, . . .) are positioned on this outer surface of the raster plate distributed mixed with one another. (FIG. 1) |
