Method of forming a doped region in a substrate and use in the fabrication of a bipolar transistor
摘要
<p>A doped region (14) is produced in a substrate (11) of silicon by diffusion of dopant from a doped glass layer (13) that is arranged on an intermediate layer (12) situated on the substrate (11) . The dopant concentration in the doped region (14) is thereby limited by the intermediate layer (12). The doped glass layer (13) is particularly produced by chemical vapor deposition of (B(OSi(CH3)3)3).</p>
申请公布号
EP0520214(B1)
申请公布日期
1996.09.18
申请号
EP19920109303
申请日期
1992.06.02
申请人
SIEMENS AKTIENGESELLSCHAFT
发明人
EHINGER, KARL, DR. DIPL.-PHYS.;BIANCO, MICHAEL, DIPL.-PHYS.;KLOSE, HELMUT, DR. DIPL.-ING.