发明名称 Method of forming a doped region in a substrate and use in the fabrication of a bipolar transistor
摘要 <p>A doped region (14) is produced in a substrate (11) of silicon by diffusion of dopant from a doped glass layer (13) that is arranged on an intermediate layer (12) situated on the substrate (11) . The dopant concentration in the doped region (14) is thereby limited by the intermediate layer (12). The doped glass layer (13) is particularly produced by chemical vapor deposition of (B(OSi(CH3)3)3).</p>
申请公布号 EP0520214(B1) 申请公布日期 1996.09.18
申请号 EP19920109303 申请日期 1992.06.02
申请人 SIEMENS AKTIENGESELLSCHAFT 发明人 EHINGER, KARL, DR. DIPL.-PHYS.;BIANCO, MICHAEL, DIPL.-PHYS.;KLOSE, HELMUT, DR. DIPL.-ING.
分类号 H01L21/225;H01L21/331;H01L29/73;H01L29/732;(IPC1-7):H01L21/225;H01L29/10 主分类号 H01L21/225
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