发明名称 PREPARATION OF PLUG STRAP USING SELECTION NITRIDE OXIDE ETCHING
摘要 PROBLEM TO BE SOLVED: To form a strap, without damaging an electrical constitution element and improve reliability by forming the plug strap by using highly selective oxide and nitride etching. SOLUTION: A first electric element contains a trench 10 filled with polysilicon, and a second electric element adheres a nitride layer 36 by the alignment on a device that includes a diffusion area 34. Then, an insulating layer 38 is adhered, and only the polysilicon trench 10 and the part of the insulating layer 38 that corresponds to the diffusion area closest to the trench are exposed. The exposed part of the insulating layer 38 is removed by applying highly selective oxide and nitride etching. Thus, the silicon oxide cap 12 of the polysilicon trench 10 and the silicide 34 in the diffusion area are dug down to expose the trench, and a strap hole is completed. Then, a conductive material is adhered in the hole, and a strap 42 which electrically connects the trench capacitor 10 with the diffusion area 34 is formed.
申请公布号 JPH08241925(A) 申请公布日期 1996.09.17
申请号 JP19950314967 申请日期 1995.12.04
申请人 INTERNATL BUSINESS MACH CORP <IBM> 发明人 MAIKERU DEEBUITSUTO AAMAKOSUTO;JIYON HAWAADO GIBUNZU;CHIYAARUZU UIRIAMU KOBAAGAA ZA SAADO;JIEROOMU BURETSUTO RASUKII
分类号 H01L21/302;H01L21/3065;H01L21/768;H01L21/8242 主分类号 H01L21/302
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