发明名称 INTERFEROMETER-TYPE MICROWAVE-SCATTERING METER
摘要 <p>PURPOSE: To make it possible to perform the high-resolution observation of the surface of the earth by arranging a plurality of interferometer-type microwave-scattering meters on a geostationary orbit at a specified interval. CONSTITUTION: The transmitted signals from an interferometer-type microwave scattering meters 1a and 1b are radiated and scattered in the waveform shapes toward the object to be observed on the surface of the earth. The reflected waves of a part of the scattering waves from the ground surface are received by a transmitting- receiving type antenna. The signals are amplified in a receiver. A/D conversion is performed and the format is formed with a signal processor. The signals are transmitted to the ground as the observed signals. The observed signals from these two scattering meters 1a and 1b, which are received on the ground, undergo signal processing, wherein the mutual signals are made to interfere by a specified processing device. Then, the components of the same phase are strengthened and the components of the negative phases are weakened. Therefore, the sharp signal waveform is obtained, and the image of the surface of the earth is obtained. As a result, the surface of the earth can be observed in high resolution. When the observation should be performed in any direction in high resolution, it is necessary to arrange three or more geostationary satellites mounting the scattering meters 1 on the orbits.</p>
申请公布号 JPH08240622(A) 申请公布日期 1996.09.17
申请号 JP19950047045 申请日期 1995.03.07
申请人 MITSUBISHI ELECTRIC CORP 发明人 ONO MAKOTO;TANAKA HIROKAZU
分类号 G01V3/17;G01R29/00;G01S13/89;(IPC1-7):G01R29/00 主分类号 G01V3/17
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