发明名称 Nonvolatile semiconductor memory device
摘要 Memory cells are arrange in the row and column directions in the form of a matrix. A transistor as a load is connected to column lines. A sense amplifier is connected to the transistor. In a read check operation, in which the data in the memory cells are erased, and the erased state of each memory cell is checked, all the row lines are set in a non-selected state by a row decoder, and all the column lines are selected by a column decoder. In this state the sum of currents flowing in the memory cells is detected by the sense amplifier. When the current detected by the sense amplifier becomes a predetermined value, a data erase operation is ended.
申请公布号 US5557570(A) 申请公布日期 1996.09.17
申请号 US19950449750 申请日期 1995.05.25
申请人 KABUSHIKI KAISHA TOSHIBA 发明人 IWAHASHI, HIROSHI
分类号 G11C17/00;G11C16/02;G11C16/16;G11C16/26;G11C16/34;H01L21/8247;H01L27/115;(IPC1-7):G11C7/00 主分类号 G11C17/00
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