发明名称 Silicon scavenger in an inductively coupled RF plasma reactor
摘要 A domed plasma reactor chamber uses an antenna driven by RF energy (LF, MF, or VHF) which is inductively coupled inside the reactor dome. The antenna generates a high density, low energy plasma inside the chamber for etching metals, dielectrics and semiconductor materials. Auxiliary RF bias energy applied to the wafer support cathode controls the cathode sheath voltage and controls the ion energy independent of density. Various magnetic and voltage processing enhancement techniques are disclosed, along with etch processes, deposition processes and combined etch/deposition processed. The disclosed invention provides processing of sensitive devices without damage and without microloading, thus providing increased yields.
申请公布号 US5556501(A) 申请公布日期 1996.09.17
申请号 US19930041796 申请日期 1993.04.01
申请人 APPLIED MATERIALS, INC. 发明人 COLLINS, KENNETH S.;RODERICK, CRAIG A.;TROW, JOHN R.;YANG, CHAN-LON;WONG, JERRY Y.;MARKS, JEFFREY;KESWICK, PETER R.;GROECHEL, DAVID W.;PINSON, II, JAY D.;ISHIKAWA, TETSUYA;LEI, LAWRENCE C.;TOSHIMA, MASATO M.;YIN, GERALD Z.
分类号 C23C16/509;H01J37/32;H01L21/311;H05H1/46;(IPC1-7):C23F1/02 主分类号 C23C16/509
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