发明名称 APPARATUS FOR MEASURING THE ACCURACY OF PARALLEL PLATEN TIE BARS
摘要 A laser apparatus for inspecting machine tie bars. The apparatus broadly comprises a laser emitter, a photocell target, a control unit, a computer, a display unit and precision adapters for mounting the emitter and target. The laser emitter is mounted on a fixed platen and oriented substantially square to a surface of the fixed platen. The target is mounted on the tie bar and intercepts a laser beam from the emitter to generate voltages which are processed in the control unit and computer. Angular and lateral deviations of the laser beam from a rotational axis of the target, which are indicative of tie bar straightness and squareness, are displayed on the display unit.
申请公布号 CA2168528(A1) 申请公布日期 1996.09.16
申请号 CA19962168528 申请日期 1996.01.31
申请人 INTRA CORPORATION 发明人 DUEY, DAVID H.;BATTISTA, JOHN A.
分类号 B29C45/80;G01B11/26;G01B11/30;(IPC1-7):G01M13/00;G01B11/27 主分类号 B29C45/80
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