| 摘要 |
PURPOSE: To provide ATM conduction characteristic test device/method which can precisely test the conduction characteristics of VP and VC even if cells continuously arrive at high speed. CONSTITUTION: In respective conduction test cell inspection parts 200A and 200B which the provided in parallel to a receiving cell 120 an error detection operation is executed as the synchronous time processing of a pseudo random pattern and the synchronous pull-in processing of the pseudo random pattern as a step-out processing to the receiving cell 120. A surface control circuit 111 selects one surface based on the synchronous state of the cell being an inspection object, which is immediately before, and a selection circuit 112 selects the output of either the conduction test cell inspection part 200A or 200B as the output of the cell in the middle of a processing. An operation control circuit 113 outputs the operation instruction of the respective conduction test cell inspection parts 200A and 200B to the next cell being a test object.
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