发明名称 METHOD AND DEVICE FOR REMOVING CARBONACEOUS IMPURITY ON SURFACE OF SILICON SUBSTRATE
摘要 PURPOSE: To provide a method and device for removing impurities remaining on the surface of a silicon substrate without performing any high-temperature heat treatment before forming a film on the surface of the substrate by epitaxial growth. CONSTITUTION: After a silicon substrate 1, from the surface of which carbonaceous impurities are to be removed, is set in a vacuum vessel 2 incorporated with a filament 4 while maintaining in room-temperature, the vessel 2 is evacuated to <=1×10<-8> Torr with a vacuum pump 3. After evacuation, an H2 gas 6 is introduced to the vessel 2 until the pressure in the vessel 2 becomes 1×10<-4> Torr and the temperature of the filament 4 is raised to about 1,800 deg.C by conducting the filament 4. As a result, the H2 gas 6 filling the vessel 2 dissociates to atomic hydrogen when the gas 6 collides with the filament 4 and a silicon hydroxide is produced when the hydrogen collides with the substrate 1 and reacts to the silicon on the surface of the substrate 1. When the silicon hydroxide leaves the substrate 1, the hydroxide carries the carbonaceous impurities.
申请公布号 JPH08236446(A) 申请公布日期 1996.09.13
申请号 JP19950035071 申请日期 1995.02.23
申请人 MITSUBISHI HEAVY IND LTD 发明人 HIROSE FUMIHIKO
分类号 C04B41/80;H01L21/203;H01L21/302;H01L21/306;H01L21/3065;(IPC1-7):H01L21/203 主分类号 C04B41/80
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