| 摘要 |
<p>PROBLEM TO BE SOLVED: To improve an information system which quickly manages the production of a monolithic semiconductor integrated circuit, especially, during the manufacture so that the production of the integrated circuit can be controlled more quickly and effectively. SOLUTION: An information system is provided with a device 1 which collects products- and manufacture-specific data and transmits the data to a data base 2 and an analyzing device 3 which analyzes the data, and the data stored in the data base 2 are analyzed by means of the device 3 in accordance with a plurality of programmable test profiles. When the test profiles exceed a preset limit, messages m1, m2, and m3 are immediately transmitted to at least one of receiving stations 5, 6, and 7 respectively assigned to the test profiles through an electronic mail system so that the testing process, operating process, or process-related inspections in the current and/or next production operations can be started.</p> |
