| 摘要 |
<p>PURPOSE: To measure the crystal state of a synthetic resin film every moment using an X-ray diffraction unit. CONSTITUTION: A preheated metal plate 3 and synthetic resin films 4, 4 are passed simultaneously through the pressure contact part 2 of laminate rolls 1, 1 held at a constant temperature thus laminating the metal plate 3 and the film 4. The high temperature laminate metal plate 5 is then cooled by a cooler 6 and the crystal state (e.g. biaxial orientation) of a film 7 laminated on the metal plate 5 is measured by an X-ray diffraction unit 8. Output signal 9 from the unit 8 is delivered to a decision unit 10 in order to determine the biaxial orientation of the film 7. With such method, crystal state of a synthetic resin film can be determined every moment.</p> |
