发明名称 METHOD AND APPARATUS FOR DETECTING EXTENT OF RESIDUAL COSMETIC ON SKIN
摘要 <p>PURPOSE: To detect the extent of residual cosmetic objectively. CONSTITUTION: A skin 2 15 irradiated with infrared light emitted from an infrared light source 1 and the reflected light is introduced through a bandpass filter 3 and a chopper 4 to a detector 5. Based on an output from the detector 5, absorbance is detected at an absorbance calculating section 6 for first and second lights and values, corresponding to the gradient of both absorbances, are calculated at a gradient calculating section 7 before being converted into an extent of residual cosmetic at a converting section 8.</p>
申请公布号 JPH08233733(A) 申请公布日期 1996.09.13
申请号 JP19950035705 申请日期 1995.02.23
申请人 DAIKIN IND LTD 发明人 MIYASHITA YOICHI;TAKESHITA RYOKO
分类号 G01N21/35;A45D44/22;G01N21/3563;(IPC1-7):G01N21/35 主分类号 G01N21/35
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