发明名称 NEAR INFRARED COMPONENT ANALYZER
摘要 PURPOSE: To realize highly accurate analysis of components over a wide range by selecting one of a plurality of narrow range measuring means based on the measurements of a wide range measuring means. CONSTITUTION: A sample 13 is arranged on the optical axis of a projection lens 9 and the quantity of reflected light is detected 8 for each film 5A-5F which pass the near infrared ray having predetermined wavelength characteristic of absorption of moisture, for example. A control section 18 determines the content of moisture and the like based on the detected values and a prestored 19 working curve. On other words, quadratic differential absorbance is determined from each detection value and a working curve I of main wavelength 1160nm is fetched from the memory section 19 thus measuring the moisture content over a wide range. A working curve II (main wavelength is 1450nm) is selected when the measurement is lower than a predetermined value M (19%, for example) otherwise a working curve III (main wavelength is 1940nm) is selected. Since a wide range measuring means carries out measurement temporarily over a wide range followed by measurement using a plurality of preset narrow range measuring means, highly accurate measurement can be realized over a wide range of moisture content.
申请公布号 JPH08233735(A) 申请公布日期 1996.09.13
申请号 JP19950037959 申请日期 1995.02.27
申请人 ISEKI & CO LTD 发明人 FUJIOKA SADAKAZU;MORI TAIICHI
分类号 G01N21/85;G01N21/35;G01N21/3554;G01N21/3563;(IPC1-7):G01N21/35 主分类号 G01N21/85
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