| 摘要 |
PROBLEM TO BE SOLVED: To apply the informations obtained from a vender test to a semiconductor memory every element to improve the reliability and performance of the memory product, by performing the vender test through using a fuse ROM programmed by external signals. SOLUTION: Fuse ROMs 10, 13 are programmed respectively by pad signals P0 , P1 applied to them through pads connected respectively with external devices. A decoder 16 decodes the output signals of the fuse ROMs 10, 13, and a sensing-amplifier enabling portion 1 outputs a sensing-amplifier enabling signal SN, and further, a delay portion 17 delays the sensing-amplifier enabling signal SN by a predetermined time through the output signals of the decoder 16. The delayed signal SN from the delay portion 7 enables a bit-line sensing amplifier 3 to amplify a very small potential difference appearing on a pair of bit lines BL,/BL.
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