摘要 |
PURPOSE:To enable invariably excellent automatic self-diagnosis by deciding abnormality according to stored feature data and fault diagnostic knowledge in response to the input of function state data on the device and updating the stored feature data according to the state data when the device is normal. CONSTITUTION:In response to the input of the function state data on the device, a fault diagnostic part 12 decides whether the device is normal or abnormal according to the feature data and fault diagnostic knowledge in an object model storage part 14. When the device is normal, the feature data of reference values in the storage part 14 are updated according to the input state data and the excellent automatic self-diagnosis is performed by using the invariably latest data. |